New technologies for seed analysis : selection of high quality seeds by X-ray analysis

conference paper
2001
Caspers, M.P.M.

Zwet, E. van

Sierat, K.

Zeijl, M. van

Valk, H.

Heistek, J.

Duijn, B. van
TNO Identifier
57395
Repository link
https://resolver.tno.nl/uuid:2e6603ae-98aa-481d-ba85-f3e87ac7ae60
Source title
Poster at the 1st International Congress on Stress Tolerance in Seeds : Genetic, Molecular and Physiological Mechanisms. Wageningen, The Netherlands, 4-7 April 2001.
Files
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