Photoluminescence Mapping of Mobile and Fixed Defects in Halide Perovskite Films
article
Halide perovskites exhibit coupled electronic-ionic properties that govern photovoltaic performance and stability; understanding ionic transport is, thus, essential for optimized photovoltaics. Characterizing ions with electrical techniques requires complete devices, yet electrical results are often dominated by interfacial effects over intrinsic ionic behavior. Here, localized-intensity-modulated photoluminescence spectroscopy (IMPLS) is used to optically probe ionic processes in a triple-cation, mixed-halide perovskite film. An analytical diffusion model is proposed to describe the IMPLS trends. The model indicates that mobile defects migrate laterally from high light intensity regions, with ionic diffusion coefficients extracted from IMPLS agreeing with the literature values. Moreover, spatially mapping IMPLS enables the separation of mobile and immobile defect contributions to the photoluminescence by quantifying the difference between the area-averaged photoluminescence intensity and phase shift. Ultimately, this work demonstrates that localized IMPLS provides a means to extract lateral ion diffusion coefficients while spatially distinguishing defect types across the sample.
TNO Identifier
1029406
ISSN
23808195
Source
ACS Energy Letters, 11(4), pp. 3330-3339.
Publisher
American Chemical Society
Collation
29 p.
Pages
3330-3339
Files
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