Contact mechanics modeling of Tip-Sample interaction in atomic force microscopy of complex layered subsurface media
conference paper
Atomic force microscopy (AFM) has been initially developed for topographic imaging. In combination with ultrasonic methods it results in an instrument useful for non-destructive characterization of mechanical properties of surfaces at the nanoscale.
TNO Identifier
1019188
Source title
13th International Workshop on Nanomechanical Sensing, NMC 2016, Delft, The Netherlands
Collation
2 p.
Files
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