Quantitative measurement of tip-sample interaction forces in tapping mode atomic force microscopy
conference paper
In Tapping Mode Atomic Force Microscopy (TMAFM), the cantilever oscillates around its resonance frequency and the tip interacts with the sample surface intermittently during each cycle. It is important to know the tip sample interaction forces to both prevent sample damage (Fig. 1a) and determine the true height of the sample surface (Fig. 1b). However, in TM AFM the nonlinear tip sample interaction cannot be estimated from harmonic motion of the cantilever.
TNO Identifier
1019034
Source title
13th International Workshop on Nanomechanical Sensing, NMC 2016, Delft, The Netherlands
Collation
2 p.
Files
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