The TPD electron probe X-ray micro analyzer

article


Fontijn, L.A.

Bok, A.B.

Kornet, J.G.
The article describes an electron probe X-ray micro-analyzer specially designed for mineralogical investigations and constructed for the Department of Mining Engineering of the Technological University, Delft. A miniature magnetic lens is used in the electron optics making it possible to employ a standard Leitz polarization microscope. The specimen can be rotated around the microscope axis and translated in two orthogonal directions. © 1968 Springer
Topics




Objective lensElectron opticLight opticElectron penetrationMicroscope axis
TNO Identifier
267621
Repository link
https://resolver.tno.nl/uuid:df00fd3a-5edc-44e2-8199-6f5633620715
Source
Geologie en Mijnbouw, 47(6), pp. 415-422.
Pages
415-422
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