Proof of Concept Demonstration and Evaluation – Use Case Electron Microscopy
report
This work presents the latest advancements in leveraging artificial intelligence (AI) and digital twin (DT) technologies to automate the operation of electron microscopes, with a particular focus on exploring the feasibility of automated electron microscope alignment. The alignment of electron microscopes is a laborious process, demanding significant time and expert knowledge. This time-intensive operation not only affects the actual experimental time available for microscope operators to investigate nanomaterials. In our approach, we employ DT and AI methodologies to automate and expedite these alignment procedures, aiming to streamline the operation of electron microscopes, reduce manual effort, and enhance the efficiency of both routine operations and the calibration of new microscope installations.
TNO Identifier
1006460
Publisher
Asimov
Collation
36 p.
Place of publication
Eindhoven