Crack depth profiling using guided wave angle dependent reflectivity

conference paper
2015
Volker, A.W.F.

Pahlavan, P.L.

Blacquière, G.
TNO Identifier
954652
Repository link
https://resolver.tno.nl/uuid:e081c228-e9c2-4520-afdf-f7b55abacfaf
ISSN
0094243X
ISBN
9780735412
Publisher
American Institute of Physics AIP
Source title
41st Annual Review of Progress in Quantitative Nondestructive Evaluation, QNDE 2014, 20-25 July 2014, Boise, ID, USA
Editor(s)
Bond, D.E.
Chimenti, L.J.
Collation
7 p.
Pages
785-791
Files
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