Micro-inclusions in HMX crystals

conference paper


Heijden, A.E.D.M. van der

Duvalois, W.

Wulp, C.J.M. van der
Topics







CrystalsField emissionGC - Gas chromatographyPBX - Plastic Bonded ExplosivesMicroscopyElectron microscopyScanningLasers
TNO Identifier
130981
Repository link
https://resolver.tno.nl/uuid:beade57e-ddfe-437c-9615-270d3fbf46a6
Place of publication
Rijswijk
Files
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