Mirror Electron Microscopy
bookPart
From the birth of electron optics (about 1920) till the late 1950s most efforts in the field of electron optics were concentrated on the theory, the design and development of the nowadays widely available transmission electron microscope. A guaranteed point resolution of less than 0.5 nm is considered normal for high quality instruments. Since the transmission electron microscope provides information about the internal structure of an electron transparent specimen, this technique does not allow for the direct investigation of surfaces of solids. Two useful alternatives are either putting both the illuminating and imaging system at a glancing angle with the surface to be examined (reflection electron microscopy) or the application of the replica technique. The indirect observation of a surface by means of a replica permits a resolving power up to 5 nm. The increasing interest in direct observation of surfaces of solids or investigation of surface phenomena has resulted during the past 15 years in the development of the following types of electron microscopes: 1. scanning electron microscope; 2. emission electron microscope; 3. reflection electron microscope; 4. mirror electron microscope.
Topics
TNO Identifier
954902
Repository link
ISSN
10765670
Source
Advances in Imaging and Electron Physics, 203, pp. 99-192.
Publisher
Elsevier
Collation
94 p.
Place of publication
Amsterdam, The Netherlands
Pages
99-192
Files
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