Radio frequency reflectometry in silicon-based quantum dots

article








Liu, Y.Y.

Philips, S.G.J.

Orona, L.A.

Samkharadze, N.

McJunkin, T.

Macquarrie, E.R.

Eriksson, M.A.

Vandersypen, L.M.K.

Yacoby, A.
Topics












CapacitanceNanocrystalsReflectionReflectometersSiliconAccumulation modesCharge readoutGate-defined quantum dotsMeasurement timeOn-chip modificationParasitic capacitanceRadio frequenciesSemiconductor quantum dots
TNO Identifier
958441
Repository link
https://resolver.tno.nl/uuid:6fb1e8ae-825f-4496-9eb8-1a46d9f4d042
ISSN
23317019
Source
Physical Review Applied, 16(1)
Publisher
American Physical Society APS
Article nr.
14057
Collation
6 p.
Place of publication
College Park, MD, USA
Files
To receive the publication files, please send an e-mail request to TNO Repository.