In-situ XRD study of Ga/In interdiffusion in Cu(In,Ga)Se2 in an industrially relevant selenization furnace
conference paper
A custom-made, highly versatile and industrially-relevant selenisation furnace with in situ XRD capabilities is presented. Mimicking an RD scale furnace used in our baseline at TNO/Solliance, it uses only elemental chalcogens and gives control over a wide set of process parameters not accessible in commercial setups. It additionally allows fast heating rates (600°C can be reached in 10 minutes) and cooling rates (10 minutes to go down from 600°C to 300°C, to mimic multiple (3+) heated chambers. An in-situ X-Ray Diffraction setup is coupled with the furnace and allows live monitoring of the phase transitions occurring in the sample. Using this setup, we carry out two selenisation experiments on sputtered precursors and observe the effect of process parameters on the interdiffusion between Ga-rich and In-rich regions.
TNO Identifier
947028
ISSN
01608371
ISBN
978-172816115-0
Publisher
IEEE
Article nr.
9300353
Source title
Conference Record of the IEEE Photovoltaic Specialists Conference
Pages
1279-1282
Files
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