Interlaboratory comparison of methodologies for measuring the angle of incidence of solar cells
conference paper
Riedell, N.
Santamaria Lancal, A.A.
Amdemskell, M.
Thorsteinsson,S.
Poulsen, P.B.
Plag, F.
Kroger, I.
Slooff, L.H.
Jsansen, M.J.
Carr, A.J.
Manshanden, P.
Bliss, M.
Betts, T.
Jauregui, I.P.
Mayo, M.E.
Balenztegui, J.L.
Roldan, R.
Kraling, U.
Baarah, G.
Isandolo, B.
Davidsen, R.S.
Thorseth, A.
Dam-Hansen, C.
Reis Benatto, G.A.
Santamaria Lancal, A.A.
Amdemskell, M.
Thorsteinsson,S.
Poulsen, P.B.
Plag, F.
Kroger, I.
Slooff, L.H.
Jsansen, M.J.
Carr, A.J.
Manshanden, P.
Bliss, M.
Betts, T.
Jauregui, I.P.
Mayo, M.E.
Balenztegui, J.L.
Roldan, R.
Kraling, U.
Baarah, G.
Isandolo, B.
Davidsen, R.S.
Thorseth, A.
Dam-Hansen, C.
Reis Benatto, G.A.
The aim of this work is to compare angle of incidence (AOI) measurement setups for solar cells
between laboratories with such capability. For the first time, we compare relative light transmission measurements among
eight laboratories, whose measurement techniques include indoor and outdoor methods. We present the relative
transmission measurements on three 156 mm x 156 mm crystalline-Si (c-Si) samples with different surface textures. The
measurements are compared using the expanded uncertainties provided by each laboratory. Five of the eight labs showed
an agreement better than ±2% to the weighted mean between AOIs from -75° to 70°. At AOIs of ±80° and ±85°, the same
five labs showed a worst case deviation to the weighted mean of -3% to 5% and 0% to 18%, respectively. When
measurement uncertainty is considered, the results show that measurements at the highest incidence angle of ±85° are
problematic, as measurements from four out of the six labs reporting uncertainty were found non-comparable within their
stated uncertainties. At 85° AOI a high to low range of up to 75% was observed between all eight laboratories
between laboratories with such capability. For the first time, we compare relative light transmission measurements among
eight laboratories, whose measurement techniques include indoor and outdoor methods. We present the relative
transmission measurements on three 156 mm x 156 mm crystalline-Si (c-Si) samples with different surface textures. The
measurements are compared using the expanded uncertainties provided by each laboratory. Five of the eight labs showed
an agreement better than ±2% to the weighted mean between AOIs from -75° to 70°. At AOIs of ±80° and ±85°, the same
five labs showed a worst case deviation to the weighted mean of -3% to 5% and 0% to 18%, respectively. When
measurement uncertainty is considered, the results show that measurements at the highest incidence angle of ±85° are
problematic, as measurements from four out of the six labs reporting uncertainty were found non-comparable within their
stated uncertainties. At 85° AOI a high to low range of up to 75% was observed between all eight laboratories
Topics
TNO Identifier
875640
Source title
36th European Photovoltaic Solar Energy Conference and Exhibition
Pages
1-6
Files
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