An Open Source Based Repository For Defects in Silicon
conference paper
Silicon is the most studied semiconductor, having
almost every aspect of it being investigated. All this information
is spread over a large set of publications, review articles and
textbooks and cannot be found in a single location. Furthermore,
the available data is not always consistent and depends on the
techniques and samples used. This problem even exists for more
specialised areas such as the study of defects in silicon
photovoltaics, which is the focus of this paper. Currently, if a
signature of a defect is experimentally determined a literature
search must then be performed through texts going back decades
in the hope to find a defect with similar properties. This paper
addresses this time consuming activity by introducing an open
source text based repository, which anyone can access or
contribute to, and that provides clearly arranged information
about defects in silicon.
almost every aspect of it being investigated. All this information
is spread over a large set of publications, review articles and
textbooks and cannot be found in a single location. Furthermore,
the available data is not always consistent and depends on the
techniques and samples used. This problem even exists for more
specialised areas such as the study of defects in silicon
photovoltaics, which is the focus of this paper. Currently, if a
signature of a defect is experimentally determined a literature
search must then be performed through texts going back decades
in the hope to find a defect with similar properties. This paper
addresses this time consuming activity by introducing an open
source text based repository, which anyone can access or
contribute to, and that provides clearly arranged information
about defects in silicon.
TNO Identifier
875638
Source title
2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC
Pages
1-5
Files
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