Three-Tiered Risk Assessment for Engineered Nanomaterials. A Use Case for the Semiconductor Industry
conference paper
Safety of engineered nanomaterials is a new scientific field, which draws increasing attention in the literature. Among the challenges the field is facing are the insufficient amount and quality of nanotoxicological data and the ambiguity in the metrics describing the exposure. This results in substantial difficulties in the actual quantification of risk in terms of exposure limits, which is a cornerstone of the regulatory chemical risk assessment. While there is no golden standard for risk assessment and management several pragmatic systems have come into being. All of these employ some form of categorization and grouping of materials into hazard groups. This paper outlines the risk assessment approach developed within the H2020 project NanoStreeM, which is based on a combination of categorical and quantitative risk assessment tools implemented in a 3-tier system. The approach includes the use of existing tools, such as ART, Consexpo and NanoSafer, in combination with the ISO standard ISO/TS 12901-2:2014 and field measurements. The paper outlines the experience with these tools for risk assessment of typical exposure scenarios present in semiconductor manufacturing. © 2019 Published under licence by IOP Publishing Ltd.
Topics
ISO StandardsNanostructured materialsRisk perceptionSafety engineeringSemiconductor device manufactureAssessment approachesChemical risk assessmentEngineered nanomaterialsQuantitative risk assessmentRisk assessment and managementsSemiconductor industrySemiconductor manufacturingTiered risk assessmentRisk assessment
TNO Identifier
870202
ISSN
17426588
Article nr.
12010
Source title
Journal of Physics: Conference Series, 6th Nanosafe International Conference on Health and Safety Issues Related to Nanomaterials for a Socially Responsible Approach, NANOSAFE 2018, 5 November 2018 through 9 November 2018