Mapping the near-field interaction of silicon nanodisc arrays by automated dual-tip scanning near-field optical microscopy
conference paper
Dual-tip scanning near-field optical microscopy (SNOM) facilitates high-precision spatial positioning of a point-like emitter and detector and has the capability of mapping optical near-field information very close to the dipole-like excitation. Hence, it opens new opportunities to characterize the optical near-field response of subwavelength photonic structures. Here we show that by using a fully automated dual-tip SNOM the local field response of a metasurface, consisting of silicon nanodiscs becomes accessible. In our measurements, one tip of the SNOM excited a single resonant nanodisc of sub-wavelength size, whereas the second tip mapped the near-field of the surrounding discs excited via in-plane coupling.
TNO Identifier
870060
ISBN
9781728104690
Publisher
Institute of Electrical and Electronics Engineers IEEE
Article nr.
8872668
Source title
Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019, Munich, Germany, 23-27 June 2019
Collation
1 p.
Files
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