Results from the Large Dynamic Range Atomic Force Microscope
other
TNO developed a novel Large Dynamic Range Atomic Force Microscope (LDRAFM), designed for sub-nm accurate metrology. The current work provides an overview of recent developments and presents the results obtained after final integration of the complete system. Results indicate impressive stability over long range, enabling subnm metrology opportunities.
Topics
TNO Identifier
867652
Publisher
TNO
Source title
SID Semicon Innovation Day, Science Centre Delft, 21 May 2019
Collation
1 p.
Place of publication
Delft
Files
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