Towards contactless scanning thermal microscopy: measuring probe-sample separation

conference paper
2018
Bijster, R.J.F.

Sadeghian Marnani, H.

Keulen, F. van
Topics
NOMI Nano Opto-Mechatronics Instruments Group
TNO Identifier
865840
Repository link
https://resolver.tno.nl/uuid:a2d2a98c-f0a1-42c7-bc3e-eb3eabcffa66
Publisher
TNO
Source title
15th International Workshop on Nanomechanical Sensing, Incheon, South Korea, 26-29 June 2018
Place of publication
Delft
Eindhoven
Files
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