EUV mask lifetime testing using EBL2
conference paper
EBL2 is TNO's platform for EUV exposure testing and surface analysis. EBL2 is capable of generating conditions relevant to EUV mask operation at all foreseen source power nodes. The authors describe how TNO performs a customized (accelerated) lifetime test on EUV masks. The required gas, EUV, and thermal parameters will be considered, and related to simulated and measured performance of EBL2. This approach can also be applied to EUV pellicles and optics.
Topics
TNO Identifier
810142
ISSN
0277786X
ISBN
9781510616585
Source
Extreme Ultraviolet (EUV) Lithography IX 2018, 26 February - 1 March 2018, 10583
Publisher
SPIE
Article nr.
1058310
Editor(s)
Goldberg, K.A.
Files
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