Thermal transient effect and improved junction temperature measurement method in high-voltage light-emitting diodes
article
The diode forward voltage method with pulsed currents was widely used for monitoring junction temperature (Tj of light-emitting diodes (LEDs). However, a thermal transient effect (TTE) was observed by the pulsed currents and consequent errors were introduced. Thermoelectric physics was conducted to explain this phenomena and a group of experiments was used to reveal the TTE during Tj measurement for high-voltage (HV) LEDs. In addition, an improved pulse-free direct junction temperature measurement method was conducted for HV LEDs to reduce the errors and to achieve in situ Tj measurement with dc currents, simpler setups, and a less step sequence. © 2013 IEEE.
Topics
TNO Identifier
478805
ISSN
07413106
Source
IEEE Electron Device Letters, 34(9), pp. 1172-1174.
Article nr.
6575116
Collation
3 p.
Pages
1172-1174
Files
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