Combination of Bayesian networks and FEM models to predict reliability of LED systems
conference paper
Intelligent LED lighting systems can save up to 80% of energy compared to incandescent lighting systems. In order to provide these products at reasonable costs, integration and miniaturization are important steps [1]. Another attractive feature of LED systems is the claimed long life expectancy. The design lifetime of LED luminaries is typically 25 to 50 thousand hours [2, 3]. The long design lifetime, in combination with short-cycled technological innovations in LED packaging, pose challenges to traditional test-in reliability engineering approaches. Innovations in LED packaging are required to meet future cost target requirements at proven and designed-in lifetimes. Integral design of complex systems - such as LED systems merging optical, thermal, electrical, and mechanical disciplines - becomes more difficult [4, 9] as reliability engineering builds on the higher specialization per discipline. In this work we explore novel approaches for reliability engineering.
Topics
TNO Identifier
507174
ISBN
9781467346450
Publisher
IEEE Computer Society
Article nr.
6542204
Source title
4th Electronic System-Integration Technology Conference, ESTC 2012, 17-20 September 2012, Amsterdam, Netherlands
Files
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