Experimental confirmation of universal relations for microring resonators in SOI technology
conference paper
We present a detailed characterization of a set of microring resonators with bent radii of 1.5 μm, fabricated in silicon-on-insulator technology. Results are in good agreement with the universal relations for coupling between microresonators and dielectric waveguides.
TNO Identifier
464715
Source title
Proceedings of the 16th European Conference on Integrated Optics (ECIO) 2012, Sitges, Spain, April 2012
Collation
2 p.
Files
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