Non-radiative recombination losses in polymer light-emitting diodes
article
We present a quantitative analysis of the loss of electroluminescence in light-emitting diodes (LEDs) based on poly[2-methoxy-5-(2′-ethylhexyloxy)- p-phenylenevinylene] (MEH-PPV) due to the combination of non-radiative trap-assisted recombination and exciton quenching at the metallic cathode. It is demonstrated that for an MEH-PPV LED the biggest efficiency loss, up to 45%, arises from extrinsic non-radiative recombination via electron traps. The loss caused by exciton quenching at the cathode proves only to be significant for devices thinner than 100 nm. Removal of electron traps by purification is expected to enhance the efficiency of polymer LEDs by more than a factor of two. © 2012 Elsevier B.V. All rights reserved.
Topics
EfficiencyLangevin recombinationNon-radiative recombinationPolymer light-emitting diodesShockley-Read-Hall recombinationTrap-assisted recombinationLangevin recombinationNon-radiative recombinationsPolymer light-emitting diodesShockley-Read-Hall recombinationsTrap-assisted recombinationCathodesEfficiencyElectroluminescenceElectron trapsOrganic light emitting diodes (OLED)Polymers
TNO Identifier
461305
ISSN
15661199
Source
Organic Electronics: physics, materials, applications, 13(6), pp. 969-974.
Pages
969-974
Files
To receive the publication files, please send an e-mail request to TNO Repository.