Simulation and qualification of a system-in-package (SiP) based solid state lighting (SSL) module
conference paper
The reliability assessment aspect of the LED field is not fully developed. The lack of complete understanding is due, in part, to the newness of the field. SSL has not existed long enough to directly gauge the accuracy of the Lifetime Assessments being made. The approach of using simulation in qualification to Lifetime Assessment is one of the major techniques used in the electronics field, in general. This methodology uses a complex approach of characterization, testing, and mathematical simulation to produce what some say is the best route for electronics reliability assessment. At present, literature surveys produce only a few papers implementing any simulation approach to SSL technology reliability assessment. © 2012 IEEE.
TNO Identifier
460789
ISBN
9781467315128
Article nr.
6191780
Source title
2012 13th International Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2012, 16 April 2012 through 18 April 2012, Cascais
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