Extending the voltage window in the characterization of electrical transport of large-area molecular junctions

article
A large bias window is required to discriminate between different transport models in large-area
molecular junctions. Under continuous DC bias, the junctions irreversibly break down at fields
over 9 MV/cm. We show that, by using pulse measurements, we can reach electrical fields of 35
MV/cm before degradation. The breakdown voltage is shown to depend logarithmically on both
duty cycle and pulse width. A tentative interpretation is presented based on electrolysis in the
polymeric top electrode. Expanding the bias window using pulse measurements unambiguously
shows that the electrical transport exhibits not an exponential but a power-law dependence on bias.
TNO Identifier
441375
Source
Applied Physics Letters, 99
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