Radiation hardness of silicon integrated nano photonic devices
conference paper
Integrated Nano Photonic (INP) sensors will be used in medical and space applications in the near future. Therefore, these devices must also be able to withstand harsh environments without failure. For space and medical applications radiation hardness is a very important issue. At TNO we have investigated the radiation hardness of nano photonic devices using electro-magnetic radiation and high energy particles. We have bombarded various ring resonators and couplers with gamma rays, protons and electrons. After the tests the device operation is verified and compared to non-radiated devices.
Topics
TNO Identifier
427942
Publisher
IEEE
Source title
Symposium IEEE Photonics Benelux Chapter, Delft, The Netherlands, 18-19 November 2010
Place of publication
Piscataway, NJ, USA
Pages
217-220
Files
To receive the publication files, please send an e-mail request to TNO Repository.