A CMOS image sensor with row and column profiling means

conference paper
2008
Xie, N.

Theuwissen, A.J.P.

Wang, X.

Leijtens, J.A.P.

Hakkesteegt, H.

Jansen, H.
This paper describes the implementation and firstmeasurement results of a new way that obtains row and column profile data from a CMOS Image Sensor, which is developed for a micro-Digital Sun Sensor (μDSS).The basic profiling action is achieved by the pixels with p-type MOS transistors which realize a so-called "Winner Takes It All (WTIA) [1][2]" principle. The WTIA implementation improves the μDSS system greatly on speed and power consumption. In this way the sensor is ideally suited for a digital sun sensor intended for astronomy applications. © 2008 IEEE.
Topics
CMOS image sensorColumn profilesDigital sun sensorMOS transistorsP-typePower ConsumptionDigital camerasDigital image storagePixelsTransistor transistor logic circuitsImage sensors
TNO Identifier
241228
Repository link
https://resolver.tno.nl/uuid:7bbe8a46-9f68-40aa-b677-087047447a7a
ISBN
9781424425808
Article nr.
No.: 4716697
Source title
IEEE Sensors, SENSORS 2008, 26-29 October 2009, Lecce, Italy
Collation
9 p.
Pages
1356-1359
Files
To receive the publication files, please send an e-mail request to TNO Repository.