On the Stability of MMIC+s Using Transistors with Inductive Source Feedback
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This paper describes potential stability problems occurring in transistor stages with inductive source feedback. These problems occur at very high frequencies, where modelling of passive components is far from trivial. Due to the increase in maximum operating frequency of submicron pHEMT transistors, this problem is recently attracting attention. After comprehensively showing the problem, a simulation strategy is suggested for a timely recognition of the problem. The effectiveness is proven for an MMIC example.
TNO Identifier
210987
Publisher
EuMA
Source title
European Microwave Week - GAAS 2004; 12th Gallium Arsenide and other Compound Semiconductors Application Symposium 11-12 October 2004, RAI, Amsterdam, The Netherlands
Place of publication
Louvain-la-Neuve
Pages
351-354
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