VEHIL: test facility for fault management testing of advanced driver assistance systems
conference paper
This paper presents the latest developments of the VEHIL facility, which aims to make the development process of intelligent vehicles safer, cheaper and more manageable. The main feature of VEHIL is that a complete intelligent vehicle can be tested in a hardware-in-the-loop simulation environment. The use of VEHIL will be illustrated by preliminary test results of a Pre-Crash System. Furthermore, a methodological approach will be presented for the validation of fault management systems for Advanced Driver Assistance Systems by fault injection in VEHIL.
Topics
TNO Identifier
362222
Collation
13 p.
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