Shock sensitivity of HMX/HTPB PBX's: Relation with HMX crystal density (Poster presentation)
conference paper
This paper describes the results which were obtained during a two-year cooperation between ICT (FRG) and TNO Prins Maurits Laboratory (ML). During this cooperation, both institutes selected a solvent from which HMX was recrystallized, with the objective to produce two grades of HMX
differing in internal crystal quality, predominantly the amount of inclusions in the crystals. After sieving of the particles, casting of the HTPB-based PBX samples, the influence of the internal crystal quality on the shock sensitivity was investigated. As a reference material for these tests, the commercially applied HMX was used.
The results of the shock sensitivity tests point at a direct relation between the HMX crystal density (and hence crystal quality) and shock sensitivity of these particles in the final PBX: the higher the crystal density, the higher the crystal quality and the lower the shock sensitivity. Comparison of the results of ICT and TNO show a very good agreement.
differing in internal crystal quality, predominantly the amount of inclusions in the crystals. After sieving of the particles, casting of the HTPB-based PBX samples, the influence of the internal crystal quality on the shock sensitivity was investigated. As a reference material for these tests, the commercially applied HMX was used.
The results of the shock sensitivity tests point at a direct relation between the HMX crystal density (and hence crystal quality) and shock sensitivity of these particles in the final PBX: the higher the crystal density, the higher the crystal quality and the lower the shock sensitivity. Comparison of the results of ICT and TNO show a very good agreement.
TNO Identifier
183155
Source title
29th International Annual Conference of ICT. Energetic Materials: Production, Processing and Characterization, Karlsruhe, Germany, 30 June-3 July 1998
Pages
65-1 - 65-11
Files
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