A 300°C Dynamic-Feedback Instrumentation Amplifier

article


Jong, P.C. de

Meijer, G.C.M.

Roermund, A.H.M. van
A high-temperature instrumentation amplifier that uses dynamic feedback is presented. It realizes dynamic feedback by means of a rotating chain of resistors to compensate for resistor mismatches. An 11x dynamic-feedback instrumentation amplifier has been integrated in a standard junction-isolated 1.6-μm CMOS process and realizes an average gain error below 25 ppm up to 250°C without calibration or trimming. Leakage currents cause additional gain errors at higher temperatures. Nevertheless, even at 300°C, this average gain error is still less than 500 ppm.
Topics






Dynamic feedbackHigh temperatureInstrumentation amplifiersLeakage currentsCMOS integrated circuitsResistorsFeedback amplifiers
TNO Identifier
95152
Repository link
https://resolver.tno.nl/uuid:bc1d237e-74f5-4d33-b677-9102822ce921
Source
IEEE Journal of Solid-State Circuits, 33(12), pp. 1999-2009.
Pages
1999-2009
Files
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