Searched for: subject%3A%22XPS%22
(1 - 8 of 8)
document
Wu, C.C. (author), te Sligte, E. (author), Bekman, H. (author), Storm, A.J. (author), van Putten, M. (author), Limpens, M.P.M.A. (author), van Veldhoven, J. (author), Deutz, A.F. (author)
EBL2 is TNO's platform for EUV exposure testing and surface analysis. EBL2 is capable of generating conditions relevant to EUV mask operation at all foreseen source power nodes. The authors describe how TNO performs a customized (accelerated) lifetime test on EUV masks. The required gas, EUV, and thermal parameters will be considered, and...
conference paper 2018
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Koster, N.B. (author), te Sligte, E. (author), Molkenboer, F.T. (author), Deutz, A.F. (author), van der Walle, P. (author), Muilwijk, P.M. (author), Mulckhuyse, W.F.W. (author), Oostdijck, B.W. (author), Hollemans, C.L. (author), Nijland, B.A.H. (author), Kerkhof, P.J. (author), van Putten, M. (author), Westerhout, J. (author)
TNO is building EBL2 as a publicly accessible test facility for EUV lithography related development of photomasks, pellicles, optics, and other components requiring EUV exposure. EBL2 consists of a EUV Beam Line, a XPS system, and sample handling infrastructure. Recently we finished installation of the source, exposure chamber, handlers and XPS...
conference paper 2017
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Koster, N.B. (author), te Sligte, E. (author), Deutz, A.F. (author), Molkenboer, F.T. (author), Muilwijk, P.M. (author), van der Walle, P. (author), Mulckhuyse, W.F.W. (author), Nijland, B.A.H. (author), Kerkhof, P.J. (author), van Putten, M. (author)
Recently TNO has established EBL2; an exposure and analysis facility for testing EUV optics, reticles and pellicles under relevant EUV scanner and source conditions. The facility and EUV source complies with the ASML power roadmap of EUV systems up to a power of 500 W IF. This enables life time testing of EUV optics, reticles and pellicles under...
conference paper 2017
document
te Sligte, E. (author), van Putten, M. (author), Molkenboer, F.T. (author), van der Walle, P. (author), Muilwijk, P.M. (author), Koster, N.B. (author), Westerhout, J. (author), Kerkhof, P.J. (author), Oostdijck, B.W. (author), Mulckhuyse, W.F.W. (author), Deutz, A.F. (author)
TNO has built EBL2; a facility for EUV exposure testing and surface analysis. EBL2 is capable of testing EUV optics, EUV photomasks, pellicles, and other components under controlled conditions, relevant to EUV scanner and source operation at all foreseen source power nodes. The system consists of an EUV beam line coupled to an X-ray...
conference paper 2017
document
te Sligte, E. (author), Koster, N.B. (author), Molkenboer, F.T. (author), Deutz, A.F. (author)
TNO is building EBL2 as a publicly accessible test facility for EUV lithography related development of photomasks, pellicles, optics, and other components. EBL2 will consist of a Beam Line, an XPS system, and sample handling infrastructure. EBL2 will accept a wide range of sample sizes, including EUV masks with or without pellicles. All types of...
conference paper 2016
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te Sligte, E. (author), Koster, N.B. (author), Deutz, A.F. (author), Staring, W.P.M. (author)
The introduction of ever higher source powers in EUV systems causes increased risks for contamination and degradation of EUV masks and pellicles. Appropriate testing can help to inventory and mitigate these risks. To this end, we propose EBL2: a laboratory EUV exposure system capable of operating at high EUV powers and intensities, and capable...
conference paper 2014
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Šimor, M. (author), Creyghton, Y. (author), Wypkema, A.W. (author), Zemek, J. (author), TNO Defensie en Veiligheid TNO Industrie en Techniek (author)
The surface of high-performance poly(ethylene terephthalate) (PET) fibers is difficult to wet and impossible to chemically bond to different matrices. Sizing applied on the fiber surface usually improves fiber wetting, but prevents good adhesion between a matrix and the fiber surface. The present study demonstrates that the plasma treatment...
article 2010
document
Zhang, X. (author), van den Bos, C. (author), Hovestad, A. (author), Terryn, H. (author), de Wit, J.H.W. (author), TNO Industrie en Techniek (author)
The corrosion behavior of Cr(VI) and Cr(III) treated zinc has been studied using scanning Kelvin probe (SKP), potentiodynamic polarization and elctrochemical impedance spectroscopy (EIS). The Volta potentials measured on the Cr(VI) or the CR(III)-A treated zinc area by SKP in a humid chamber are more negative than on the untreated zinc area,...
bookPart 2007
Searched for: subject%3A%22XPS%22
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