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Kudryavtsev, Y.V. (author), Gelinck, E.R.M. (author), Fischer, H.R. (author), TNO Industrie en Techniek (author)
A theoretical investigation of van der Waals forces acting between two solid silicon surfaces at separations from zero to approximately 20 nm is presented. We focused our efforts on the analysis of different factors that can cause deviations from the classical pressure-distance dependence p ∼ 1/D3. It is demonstrated that a layer (oxide or water...
article 2009