Searched for: subject%3A%22Optical%255C%2Bfabrication%22
(1 - 6 of 6)
document
Grant-Jacob, J.A. (author), Mills, B. (author), Feinaeugle, M. (author), Sones, C.L. (author), Oosterhuis, G. (author), Hoppenbrouwers, M.B. (author), Eason, R.W. (author)
We demonstrate the use of laser-induced forward transfer (LIFT) in combination with a novel donor replenishment scheme to print continuous copper wires. Wires of mm length, a few microns wide and submicron in height have been printed using a 800 nm, 1 kHz repetition rate, 150 fs pulsed laser. A 120 nm thick copper donor was used along with laser...
article 2013
document
Technisch Physische Dienst TNO - TH (author), van Brug, H. (author), Groeneveld, M. (author), Booij, S.M. (author), Braat, J.J.M. (author)
A prototype of a system for in-process monitoring of material removal in fluid jet polishing (FJP) is presented. The measurements make use of temporal phase unwrapping (TPU) allowing for a large working range. The measurement system will be discussed, with all problems that had to be overcome like water on the surface and vibrations, as well as...
conference paper 2002
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Technisch Physische Dienst TNO - TH (author), van der Bijl, R.J.M. (author), van Brug, H. (author), Fähnle, O.W. (author), Braat, J.J.M. (author)
The results obtained with iTIRM during polishing are presented. It is shown that iTIRM unites the working ranges of several other techniques where iTIRM can be used during production where the others can not. The applicable range of iTIRM is shown to be at least 1 um down to 0.1 nm rms.
conference paper 2001
document
Fähnle, O.W. (author), Debruyne, S. (author), Wons, T. (author), van der Bijl, R.J.M. (author), van Brug, H. (author), Braat, J.J.M. (author), Technisch Physische Dienst TNO - TH (author)
conference paper 2000
document
van der Bijl, R.J.M. (author), Fähnle, O.W. (author), van Brug, H. (author), Braat, J.J.M. (author), Technisch Physische Dienst TNO - TH (author)
A new measurement method, called iTIRM, is presented. It is capable of measuring the surface quality, roughness and subsurface damage, of optical surfaces in a nondestructive way. Measurements have been carried out and are presented, showing the capability of iTIRM to quantify the quality of optical surfaces and to localize surface defects. The...
conference paper 2000
document
van der Bijl, R.J.M. (author), Fähnle, O.W. (author), van Brug, H. (author)
A new method is presented that is capable of measuring the surface quality, including subsurface damage, of optical surfaces. This method, called iTIRM, can easily be automated and used for process control and as an investigation tool for optical fabrication processes.
conference paper 1999
Searched for: subject%3A%22Optical%255C%2Bfabrication%22
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