Mapping buried nanostructures using subsurface ultrasonic resonance force microscopy

Feasibility study of photo thermal acoustic imaging of buried nanowires in Gate-All-Around Nanowire FETs

A large fiber sensor network for an acoustic neutrino telescope

In situ TEM observation of the Boudouard reaction: Multi-layered graphene formation from CO on cobalt nanoparticles at atmospheric pressure

Electromagnetic deformable mirror for space applications

High-throughput atomic force microscopes operating in parallel

Nanopositioning MEMS stage for high speed positioning of metamaterials lenses for use in high resolution optical imaging

Performance of AO predictive control in the presence of non-stationary turbulence

Feasibility study of photo thermal acoustic imaging of buried nanowires in Gate-All-Around (GAA) nanowire FETs

Recent progress in the upgrade of the TCV EC-system with two 1MW/2s dual-frequency (84/126GHz) gyrotrons

Automated cantilever exchange and optical alignment for high-throughput parallel Atomic Force Microscopy

Characterizing electron beam induced damage in metrology and inspection of advance devices

High throughput, parallel scanning probe microscope for nanometrology and nanopatterning applications

Multi-material topology optimization of viscoelastically damped structures using a parametric level set method

First light on EBL2

3rd 3D Nanomanufacturing Workshop, 6 November 2017, Delft, The Netherlands

In-line height profiling metrology sensor for zero defect production control

Minimizing tip-sample forces and enhancing sensitivity in atomic force microscopy with dynamically compliant cantilevers

Analysis of contact stiffness in ultrasound atomic force microscopy: three-dimensional time-dependent ultrasound modeling

Realisation of a vacuum system of an EUV Exposure System