Searched for: subject%3A%22Nanotechnology%22
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Krystek, P. (author), Shandilya, N. (author), Fransman, W. (author)
Driven by the concept of the ‘four generations of nanomaterials’, the current state of the knowledge on risk assessment of future generation is explored for active nanomaterials. Through case studies, we identify challenges and evaluate the preparedness of characterization methods, available risk assessment modeling tools, and analytical...
article 2021
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Pizzol, L. (author), Hristozov, D. (author), Zabeo, A. (author), Gianpietro, B. (author), Wohlleben, W. (author), Koivisto, A.J. (author), Jensen, K.A. (author), Fransman, W. (author), Stone, V. (author), Marcomini, A. (author)
The increasing use of engineered nanomaterials (ENMs) in nano-enabled products (NEPs) has raised societal concerns about their possible health and ecological implications. To ensure a high level of human and environmental protection it is essential to properly estimate the risks of these new materials and to develop adequate risk management...
article 2019
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Soeteman-Hernandez, L.G. (author), Apostolova, M.D. (author), Bekker, C. (author), Dekkers, S. (author), Grafström, R.C. (author), Groenewold, M. (author), Handzhiyski, Y. (author), Herbeck-Engel, P. (author), Hoehener, K. (author), Karagkiozaki, V. (author), Kelly, S. (author), Kraegeloh, A. (author), Logothetidis, S. (author), Micheletti, C. (author), Nymark, P. (author), Oomen, A. (author), Oosterwijk, T. (author), Rodríguez-LLopis, I. (author), Sabella, S. (author), sanchez Jiménez, A. (author), Sips, A.J.A.M. (author), Suarez-Merino, B. (author), Tavernaro, I. (author), van Engelen, J. (author), Wijnhoven, S.W.P. (author), Noorlander, C.W. (author)
Nanotechnologies are characterized by a growing legacy of already marketed and novel manufactured nanomaterials (MNMs) and nano-enabled products with a lack of a coherent risk governance system to address their safety effectively. In response to this situation, a proactive system is needed to minimize the gap between the pace of innovation and...
article 2019
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Krizek, F. (author), Sestoft, J.E. (author), Aseev, P. (author), Marti-Sanchez, S. (author), Vaitiekénas, S. (author), Casparis, L. (author), Khan, S.A. (author), Liu, Y. (author), Stankevic, T. (author), Whiticar, A.M. (author), Fursina, A. (author), Boekhout, F. (author), Koops, R. (author), Uccelli, E. (author), Kouwenhoven, L.P. (author), Marcus, C.M. (author), Arbiol, J. (author), Krogstrup, P. (author)
Semiconductor nanowires have shown great potential in various quantum transport experiments. However, realizing a scalable high-quality nanowire-based platform that could lead to quantum information applications has been challenging. Here, we study the potential of selective area growth by molecular beam epitaxy of InAs nanowire networks grown...
article 2018
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van der Walle, P. (author), Kramer, E. (author), Ebeling, R.P. (author), Spruit, W.E.T. (author), Alkemade, P. (author), Pereira, S. (author), van der Donck, J.C.J. (author), Maas, D.J. (author)
We report on advanced defect classification using TNO's RapidNano particle scanner. RapidNano was originally designed for defect detection on blank substrates. In detection-mode, the RapidNano signal from nine azimuth angles is added for sensitivity. In review-mode signals from individual angles are analyzed to derive additional defect...
conference paper 2018
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van der Heijden, A.E.D.M. (author)
In the domain of energetic nanomaterials, more specifically nano-sized explosives and oxidizers, many small scale production methods have been explored up to now. So far only limited attempts have been made to scale up the production to tens or maximally a few hunderds of grams. This paper provides a review of these small scale production...
article 2018
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Navarro, V. (author), Mohtashami, A. (author), Herfst, R.W. (author), Maturova, K. (author), van Es, M.H. (author), Piras, D. (author), Sadeghian Marnani, H. (author)
As the pitch approaches the 10nm node, in order to meet current and future patterning challenges, high resolution techniques are required, complementary to extreme ultraviolet lithography (EUVL) for high volume manufacturing of nanodevices. These complementary techniques should have the following specifications: 1) High patterning resolution,...
conference paper 2018
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Further scaling and miniaturization of nanodevices (nanoelectronics, Quantum devices bio-nano devices for healthcare) brings major manufacturing, metrology and characterization challenges that cannot be met anymore by current techniques. The High Volume Manufacturing industry requires, more than ever, metrology methods that routinely measure...
conference paper 2017
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conference paper 2017
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By end of 2017 there will be more than 8.4 billion connected devices (Gartner 2017). This means for the first time, Internet of Things (IoT) devices will outnumber the world’s population. In 2020, the number of connected devices will increase to more than 20 billion. This means nearly every devices we own or can imagine will be connected to the...
conference paper 2017
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Kruit, P. (author), de Kroon, M.G.M. (author), Maas, D.J. (author), Baumer, S.M.B. (author), Spruit, W.E.T. (author)
The field of 3D nano-structuring and metrology is advancing rapidly in the Netherlands and the rest of the world. In general, the quality of the involved investigators, knowledge institutes and companies in the Netherlands is world-class. Many Dutch academic groups / knowledge institutes / companies are world-leading in their own nano-arena. A...
report 2017
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Maas, D.J. (author)
The goal of the workshop is to provide a high level, invited only, international community that accelerates interactions between the main target groups: universities, institutes, entrepreneurs, intrapreneurs and investors in order to facilitate customer development, application discovery or funding start-ups & spin-offs to expand internationally...
conference paper 2017
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Senes, A. (author), Meskers, S.C.J. (author), Greiner, H. (author), Suzuki, K. (author), Kaji, H. (author), Adachi, C. (author), Wilson, J.S. (author), Janssen, R.A.J. (author)
The efficiency of organic light emitting diodes (OLEDs) can be improved by controlling the orientation of the transition dipole moment of the emitters. Currently, no effective methods exist for orienting the transition dipole moments in solution processed active layers for OLEDs. We investigate the orientation of the transition dipole moment of...
article 2017
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Zhang, H. (author), Gül, Ö. (author), Conesa-Boj, S. (author), Nowak, M.P. (author), Wimmer, M. (author), Zuo, K. (author), Mourik, V. (author), de Vries, F.K. (author), van Veen, J. (author), de Moor, M.W.A. (author), Bommer, J.D.S. (author), van Woerkom, D.J. (author), Car, D. (author), Plissard, S.R. (author), Bakkers, E.P.A.M. (author), Quintero Pérez, M. (author), Cassidy, M.C. (author), Koelling, S. (author), Goswami, S. (author), Watanabe, K. (author), Taniguchi, T. (author), Kouwenhoven, L.P. (author)
Semiconductor nanowires have opened new research avenues in quantum transport owing to their confined geometry and electrostatic tunability. They have offered an exceptional testbed for superconductivity, leading to the realization of hybrid systems combining the macroscopic quantum properties of superconductors with the possibility to control...
article 2017
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van der Walle, P. (author), Kramer, E. (author), van der Donck, J.C.J. (author), Mulckhuyse, W.F.W. (author), Nijsten, L. (author), Bernal Arango, F.A. (author), de Jong, A. (author), van Zeijl, E. (author), Spruit, H.E.T. (author), van den Berg, J.H. (author), Nanda, G. (author), van Langen-Suurling, A.K. (author), Alkemade, P.F.A. (author), Pereira, S.F. (author), Maas, D.J. (author)
Particle defects are important contributors to yield loss in semi-conductor manufacturing. Particles need to be detected and characterized in order to determine and eliminate their root cause. We have conceived a process flow for advanced defect classification (ADC) that distinguishes three consecutive steps; detection, review and classification...
conference paper 2017
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Pilipenko, A.O. (author), Nedilko, S.A. (author), Dziazko, O.G. (author), Voitenko, T.A. (author), Fesich, I.V. (author), Zelenko, M.A. (author), Strutynska, N.Yu. (author), Galagan, Y. (author), Golovchenko, O.I. (author)
We synthesized composites based on hightemperature superconducting ceramics YBa2Cu3O6.91 (Y123) with polymer additives poly(ethylene glycol) dimethacrylate (poly(EGDMA)). We studied the effect of additives in the obtained nanocomposites on processes of their degradation under the action of steam and water at various temperatures as well as...
conference paper 2017
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Sadeghian Marnani, H. (author), Paul, P.C. (author), Herfst, R.W. (author), Dekker, A. (author), Winters, J. (author), Maturova, K. (author)
Scanning Probe microscope (SPM) is an important nanoinstrument for several applications such as bioresearch, metrology, inspection and nanopatterning. Single SPM is associated with relatively slow rate of scanning and low throughput measurement, thus not being suitable for scanning large samples such as semiconductor wafers and photolithography...
conference paper 2017
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Koek, W.D. (author), van Zwet, E.J. (author), Sadeghian Marnani, H. (author)
Traditionally, (dark field) imaging based, particle detection systems rely on identifying a particle based on its irradiance. It can be shown that for a very smooth wafer with 0.1 nm surface roughness (rms) this approach results in a particle detection limit larger than 20 nm. By carefully studying the physical mechanism behind this practical...
conference paper 2016
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van der Donck, J.C.J. (author), Bussink, P.G.W. (author), Fritz, E.C. (author), van der Walle, P. (author)
Cleanliness is a prerequisite for obtaining economically feasible yield levels in the semiconductor industry. For the next generation of lithographic equipment, EUV lithography, the size of yield-loss inducing particles for the masks will be smaller than 20 nm. Consequently, equipment for handling EUV masks should not add particles larger than...
article 2016
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Fransman, W. (author), Bekker, C. (author), Tromp, P. (author), Duis, W.B. (author)
Increasing production and applications of manufactured nano objects (MNOs) have become a source for human exposure and therefore raise concerns and questions about the possible health effects. In this study, the potential release of nano objects, their agglomerates, and aggregates (NOAA) as a result of sanding of hardwood treated with MNOs...
article 2016
Searched for: subject%3A%22Nanotechnology%22
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