Image-based overlay measurement using subsurface ultrasonic resonance force microscopy

Structural transformation of layered double hydroxides: An in situ TEM analysis

High-throughput scanning probe instruments for nanopatterning, alignment, and overlay metrology

Poly-crystalline silicon-oxide films as carrier-selective passivating contacts for c-Si solar cells

Real-Time Monitoring of Size and Concentration of Nanoparticles Inside a Reactor Using Ultrasound

Efficient and Stable Acoustical Coupling for GHz Subsurface Probe Microscopy

Determination of metal-based nanoparticles in the river Dommel in the Netherlands via ultrafiltration, HR-ICP-MS and SEM

Global excitation and local probing of ferroelectric domains

A new approach combining analytical methods for workplace exposure assessment of inhalable multi-walled carbon nanotubes

Automated cantilever exchange and optical alignment for high-throughput parallel Atomic Force Microscopy

Characterizing electron beam induced damage in metrology and inspection of advance devices

Plasma-assisted atomic layer deposition of conformal Pt films in high aspect ratio trenches

Chaos: the speed limiting phenomenon in dynamic atomic force microscopy

Ferroelectricity and piezoelectricity in soft biological tissue: Porcine aortic walls revisited

Deep sub-wavelength metrology for advanced defect classification

In-situ tensile testing of propellants in SEM: Influence of temperature

Energetic materials research using scanning electron microscopy

The indoor fungus Cladosporium halotolerans survives humidity dynamics markedly better than Aspergillus niger and Penicillium rubens despite less growth at lowered steady-state water activity

Sub 20nm particle inspection on EUV mask blanks

Confocal scanning laser microscopic study of the RDX defect structure in deformed polymer-bonded explosives