Searched for: subject:"Barriers"
(1 - 3 of 3)
document
van de Weijer, P. (author), Bouten, P.C.P. (author), Unnikrishnan, S. (author), Akkerman, H.B. (author), Michels, J.J. (author), van Mol, T.M.B. (author)
Organic light-emitting diodes degrade rapidly by means of local cathode oxidation when exposed to the ambient atmosphere, resulting in visible non-emissive areas called black spots. High performance inorganic based encapsulations are required to protect the OLED. We have applied a hybrid thin-film encapsulation stack consisting of two inorganic...
article 2017
document
Van Assche, F.J.H. (author), Unnikrishnan, S. (author), Michels, J.J. (author), van Mol, A.M.B. (author), van de Weijer, P. (author), van de Sanden, M.C.M. (author), Creatore, M. (author)
We report on a low substrate temperature (110°C) remote microwave plasma-enhanced chemical vapor deposition (PECVD) process of silicon nitride barrier layers against moisture permeation for organic light emitting diodes (OLEDs) and other moisture sensitive devices such as organic photovoltaic cells (OPVs). Specifically, the influence of the SiH4...
article 2014
document
van Assche, F.J.H. (author), Rooms, H.C.A. (author), Young, E.W.A. (author), Michels, J. (author), van Mol, A.M.B. (author), Rietjens, G. (author), van de Weijer, P. (author), Bouten, P. (author), TNO Industrie en Techniek (author)
Within the Holst centre a transparent barrier on foil has been under development which is based on low-temperature plasma deposited silicon nitride films as intrinsic moisture barrier, stacked with planarization layers to spatially separate defects in these films. OLED lifetime testing and water vapor transmission rate measurements using a Ca...
conference paper 2008