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Dos Santos Ferreira, O. (author), Gelinck, E.R.M. (author), de Graaf, D. (author), Fischer, H. (author), TNO Industrie en Techniek (author)
Adhesion measurements were performed by AFM (Atomic Force Microscopy). It was shown that many parameters need to be controlled in order to provide reproducible and quantitative results. Adhesion forces were shown to depend on combination of materials characteristics and testing geometry as well as experimental protocol (contact time, contact...
article 2010