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- Roozeboom, F. (author) conference paper 2020
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- Roozeboom, F. (author) conference paper 2020
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Traditionally, the topics of this annual symposium focus upon the continuous scaling in CMOS integrated circuit manufacturing (More Moore and Beyond Moore for short) combined with the opportunities from growing diversification including sensors and embedded functionality (More than Moore). Thus, the main objective is to exchange recent advances...conference paper 2018
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- conference paper 2017
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Roozeboom, F. (author), Narayanan, V. (author), Kakushima, K. (author), Timans, P.J. (author), Gusev, E.P. (author), Karim, Z. (author), De Gendt, S. (author)The topics of this annual symposium continue to describe the evolution of traditional scaling in CMOS integrated circuit manufacturing (More Moore for short), combined with the opportunities from growing diversification and embedded functionality (More than Moore). Once again, the main objective was to address the latest advances in channel,...book 2016
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- Roozeboom, F. (author), De Gendt, S. (author), Delabie, A. (author), Elam, J.W. (author), Londergan, A. (author), van der Straten, O. (author) conference paper 2015
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- Kondo, K. (author), Mathad, G.S. (author), Akolkar, R. (author), Dow, W.P. (author), Philipsen, H. (author), Hayase, M. (author), Koyanagi, M. (author), Kaneko, Y. (author), Roozeboom, F. (author) conference paper 2015
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- Roozeboom, F. (author), De Gendt, S. (author), Delabie, A. (author), Elam, J.W. (author), Londergan, A. (author), van der Straten, O. (author) conference paper 2014
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- Roozeboom, F. (author), De Gendt, S. (author), Delabie, A. (author), Elam, J.W. (author), Londergan, A. (author), van der Straten, O. (author) conference paper 2013
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- Roozeboom, F. (author), Kniknie, B. (author), Lankhorst, A.M. (author), Winands, G. (author), Knaapen, R. (author), Smets, M. (author), Poodt, P. (author), Dingemans, G. (author), Keuning, W. (author), Kessels, W.M.M. (author) article 2013
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Dragoi, V. (author), Czurratis, P. (author), Brand, S. (author), Beyersdorfer, J. (author), Patzig, C. (author), Krugers, J.P. (author), Schrank, F. (author), Siegert, J. (author), Petzold, M. (author)In this paper, a brief summary of potential defect formation and failure characteristics for low temperature plasma-assisted Si wafer bonding in correlation to different influencing factors is given. In terms of a failure catalogue classification, these defects are related to incoming material quality variation, wafer bonding equipment and...conference paper 2012
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- Elam, J.W. (author), Londergan, A. (author), van der Straten, O. (author), Roozeboom, F. (author), De Gendt, S. (author), Bent, S.F. (author), Delabie, A. (author) conference paper 2012
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Roozeboom, F. (author), Kniknie, B. (author), Knaapen, R. (author), Smets, M. (author), Illiberi, A. (author), Poodt, P. (author), Dingemans, G. (author), Keuning, W. (author), Kessels, W.M.M. (author)Conventional Deep Reactive Ion Etching (DRIE) is a plasma etch process with alternating half-cycles of 1) Si-etching with SF6 to form gaseous SiFx etch products, and 2) passivation with C4F8 that polymerizes as a protecting fluorocarbon deposit on the sidewalls and bottom of the etched features. In this work we report on a novel alternative and...conference paper 2012
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- Elam, J.W. (author), De Gendt, S. (author), van der Straten, O. (author), Delabie, A. (author), Londergan, A. (author), Bent, S.F. (author), Roozeboom, F. (author) conference paper 2011
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- Elam, J.W. (author), De Gendt, S. (author), van der Straten, O. (author), Delabie, A. (author), Londergan, A. (author), Bent, S.F. (author), Roozeboom, F. (author) conference paper 2010
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- Flake, J.C. (author), Ramm, P. (author), Rathore, H.S. (author), Roozeboom, F. (author), Mathad, G.S. (author), Leonte, O.M. (author) conference paper 2010