Searched for: author%3A%22van+Riel%2C+M.C.J.M.%22
(1 - 13 of 13)
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Quesson, B.A.J. (author), van Neer, P.L.M.J. (author), Tamer, M.S. (author), Hatakeyama, K. (author), van Es, M.H. (author), van Riel, M.C.J.M. (author), Piras, D. (author)
The semiconductor industry needs to fit ever more devices per unit area to improve their performance; hence a trend towards increasingly complex structures by varying material combinations and 3D geometries with increasing aspect ratios. The new materials used may be optically opaque, posing problems for traditional optical metrology methods....
conference paper 2022
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Pohl, R. (author), Blok, C. (author), Simmelink, K. (author), Biesheuvel, R. (author), Resink, S. (author), Nijenhuis, J.R. (author), van Riel, M.C.J.M. (author), Kamphues, F.G. (author), Calia, D.B. (author), Hackenberg, W. (author)
We report on the development of a Beam Conditioning and Diagnostics System (BCDS) that will be employed in the Laser Projection System (LPS) of the Extremely Large Telescope (ELT) of ESO. This conference article provides an overview about the detailed design of the BCDS and it summarizes the work of the development phase of this project. To this...
conference paper 2022
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van Neer, P.L.M.J. (author), Quesson, B.A.J. (author), Tamer, M.S. (author), Hatakeyama, K. (author), van Es, M.H. (author), van Riel, M.C.J.M. (author), Piras, D. (author)
Several methods are being researched to detect and characterize buried nanoscale structures in hard solid samples. The most common acoustic method is acoustic microscopy. An acoustic microscope is based on a single element transducer operating in pulse-echo mode. The acoustic waves are coupled into a sample using a liquid couplant (eg water) and...
article 2021
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van Riel, M.C.J.M. (author), Jonker, W.A. (author), Maniscalco, M.P. (author)
public lecture 2019
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van Neer, P.M.L.J. (author), Quesson, B.A.J. (author), van Es, M.H. (author), van Riel, M.C.J.M. (author), Hatakeyama, K. (author), Mohtashami, A. (author), Piras, D. (author), Duivenvoorde, T. (author), van der Lans, M.J. (author), Sadeghian Marnani, H. (author)
The characterization of buried nanoscale structures nondestructively is an important challenge in a number of applications, such as defect detection and metrology in the semiconductor industry. A promising technique is Subsurface Scanning Probe Microscopy (SSPM), which combines ultrasound with Atomic Force Microscopy (AFM). Initially, SSPM was...
article 2019
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van Neer, P.L.M.J. (author), van Riel, M.C.J.M. (author), van Es, M.H. (author), Shoeibi Omrani, P.S. (author), Hatakeyama, K. (author), Mohtashami, A. (author), Quesson, B.A.J. (author), van der Lans, M.J. (author), Sadeghian Marnani, H. (author)
other 2019
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van Reijzen, M.E. (author), Tamer, M.S. (author), van Es, M.H. (author), van Riel, M.C.J.M. (author), Keyvani Janbahan, A. (author), Sadeghian Marnani, S. (author), van der Lans, M.J. (author)
In this paper, we present an AFM based subsurface measurement technique that can be used for overlay and critical dimensions (CD) measurements through optically opaque layers. The proposed method uses the surface elasticity map to resolve the presence and geometry of subsurface structures. To improve the imaging performance of the AFM based...
conference paper 2019
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Keyvani Janbahan, A. (author), van Reijzen, M.E. (author), Tamer, M.S. (author), van Es, M.H. (author), van Riel, M.C.J.M. (author), Sadeghian Marnani, S. (author), van der Lans, M.J. (author)
public lecture 2019
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van Reijzen, M.E. (author), Tamer, M.S. (author), van Es, M.H. (author), van Riel, M.C.J.M. (author), Duivenvoorde, T. (author), Keyvani Janbahan, A. (author), Sadeghian Marnani, S. (author), van der Lans, M.J. (author)
In the semiconductor industry, the need for characterization of subsurface features of wafers on a sub-nanometer level becomes ever more important. With Scanning Subsurface Probe Microscopy (SSPM), the smallest features can be measured with high resolution.
other 2019
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van Es, M.H. (author), van Riel, M.C.J.M. (author), Duivenvoorde, T. (author), Sadeghian Marnani, H. (author)
Scanning Subsurface Ultrasonic Force Microscopy (SSURFM) relies on high frequency ultrasound in combination with Atomic Force Microscopy to detect viscoelastic properties of buried materials with high spatial resolution. The key ingredient is a very high frequency ultrasound wave which is amplitude modulated at the sensing cantilevers resonance...
other 2019
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Saathof, R. (author), Crowcombe, W.E. (author), Kuiper, S. (author), van der Valk, N.C.J. (author), Pettazzi, F. (author), de Lange, T.J. (author), Kerkhof, P.J. (author), van Riel, M.C.J.M. (author), de Man, H. (author), Truyens, D.C. (author), Ferrario, I. (author)
Optical communications will complement radio frequency (RF) communications in the coming decades to enhance throughput, power efficiency and link security of satellite communication links. To enable optical communications technology for intersatellite links and (bi-directional) ground to satellite links, TNO develops a suite of technologies in...
conference paper 2018
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Quesson, B.A.J. (author), van Neer, P.L.M.J. (author), van Riel, M.C.J.M. (author), van Es, M.H. (author), Piras, D. (author), Hatakeyama, K. (author), Mohtashami, A. (author), Navarro, V. (author), Duivenvoorde, T. (author), Sadeghian Marnani, H. (author)
Many techniques are under development for the detection of subsurface defects or cracks. One such method is GHz subsurface probe microscopy (GHz SSPM). Here, modulated GHz elastic waves are transmitted through the bottom of a sample. The waves are scattered by buried features and detected using the probe of an atomic force microscope (AFM),...
conference paper 2018
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Kuiper, S. (author), Doelman, N.J. (author), Nieuwkoop, E. (author), Overtoom, A.J. (author), Russchenberg, T. (author), van Riel, M.C.J.M. (author), Wildschut, J.A. (author), Baeten, M.J.J. (author), Human, J.D. (author), Spruit, W.E.T. (author), Brinkers, S. (author), Maniscalco, M.P. (author)
Over the last decade TNO has developed a deformable mirror concept using electromagnetic actuators with the main advantages of having very low non-linearity and hysteresis, low power consumption, and high inherent reliability of the actuators. TNO recently started a program to redesign the electromagnetic actuator to improve the actuator...
conference paper 2016
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