Searched for: author%3A%22Nijsten%2C+L.%22
(1 - 3 of 3)
Coopmans, T. (author), Knegjens, R. (author), Dahlberg, A. (author), Maier, D. (author), Nijsten, L. (author), de Oliveira Filho, J. (author), Papendrecht, M. (author), Rabbie, J. (author), Rozp?dek, F. (author), Skrzypczyk, M. (author), Wubben, L. (author), de Jong, W. (author), Podareanu, D. (author), Torres-Knoop, A. (author), Elkouss, D. (author), Wehner, S. (author)
article 2021
van den Broek, A.C. (author), van der Velde, J. (author), van den Baar, R.M.E.M. (author), Nijsten, L. (author), van Heijster, R. (author)
We present a study of border surveillance systems for automatic threat estimation. The surveillance systems should allow border control operators to be triggered in time so that adequate responses are possible. Examples of threats are smuggling, possibly by using small vessels, cars or drones, and threats caused by unwanted persons (e.g....
conference paper 2019
van der Walle, P. (author), Kramer, E. (author), van der Donck, J.C.J. (author), Mulckhuyse, W.F.W. (author), Nijsten, L. (author), Bernal Arango, F.A. (author), de Jong, A. (author), van Zeijl, E. (author), Spruit, W.E.T. (author), van den Berg, J.H. (author), Nanda, G. (author), van Langen-Suurling, A.K. (author), Alkemade, P.F.A. (author), Pereira, S.F. (author), Maas, D.J. (author)
Particle defects are important contributors to yield loss in semi-conductor manufacturing. Particles need to be detected and characterized in order to determine and eliminate their root cause. We have conceived a process flow for advanced defect classification (ADC) that distinguishes three consecutive steps; detection, review and classification...
conference paper 2017