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Stolk, A.J. (author), van der Enden, K.L. (author), Roehsner, M.C. (author), Teepe, A. (author), Faes, S.O.F. (author), Bradley, C.E. (author), Cadot, S. (author), van Rantwijk, J. (author), te Raa, I. (author), Hagen, R.A.J. (author), Verlaan, A.L. (author), Biemond, J.J.B. (author), Khorev, A. (author), Vollmer, R. (author), Markham, M. (author), Edmonds, A.M. (author), Morits, J.P.J. (author), Taminiau, T.H.T. (author), van Zwet, E.J. (author), Hanson, R. (author)Entanglement distribution over quantum networks has the promise of realizing fundamentally new technologies. Entanglement between separated quantum processing nodes has been achieved on several experimental platforms in the past decade. To move toward metropolitan-scale quantum network test beds, the creation and transmission of...article 2022
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Biemond, J.J.B. (author), Postoyan, R. (author), Heemels, W.P.M.H. (author), van de Wouw, N. (author)We investigate stability of a solution of a hybrid system in the sense that the graphs of solutions from nearby initial conditions remain close and tend towards the graph of the given solution. In this manner, a small continuous-time mismatch is allowed between the jump times of neighbouring solutions and the ‘peaking phenomenon’ is avoided. We...article 2020
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Biemond, J.J.B. (author), Herfst, R.W. (author), Rajadurai, S.R.S. (author)Sub-resonant tapping atomic force microscopy enables topography measurements with limited lateral tipsample forces, while overcoming the limitations of excessive damage and measurement errors that occur during amplitude modulated operation on high aspect ratio samples. Therefore, it is a candidate to enable process quality monitoring in...conference paper 2020
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- Rijnen, M. (author), Biemond, J.J.B. (author), van de Wouw, N. (author), Saccon, A. (author), Nijmeijer, H. (author) article 2020
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Herfst, R.W. (author), Nulkes-de Groot, N. (author), Lucas, P. (author), Bijnagte, T. (author), Dekker, B. (author), Biemond, J.J.B. (author), van Riel, M.J.C.M. (author), van Essen, B.H.M.F. (author), van Koppen, M.E.C.T. (author), Oosterling, J.A.J. (author), Kramer, L. (author), Nieuwkoop, E. (author), Corbet, F. (author), Visser, L. (author), Man, H. (author)We developed a new 3D-AFM technique that enables imaging of high aspect ratio trenches. By measuring both lateral and vertical forces on a cantilever tip, a subharmonic mode based on the attractive tip-sample forces becomes feasible. This enables the measurement of true 3D information of samples without causing damage. This is especially...other 2019