Title
Super-Resolution without Imaging Library-Based Approaches using Near-to-Far-Field Transduction by a Nanophotonic Structure
Author
Buijs, R.D.
Schilder, N.J.
Wolterink, T.A.W.
Gerini, G.
Verhagen, E.
Koenderink, A.F.
Publication year
2020
Abstract
Super-resolution imaging is often viewed in terms of engineering narrow point spread functions, but nanoscale optical metrology can be performed without real-space imaging altogether. In this paper, we investigate how partial knowledge of scattering nanostructures enables extraction of nanoscale spatial information from far-field radiation patterns. We use principal component analysis to find patterns in calibration data and use these patterns to retrieve the position of a point source of light. In an experimental realization using angle-resolved cathodoluminescence, we retrieve the light source position with an average error below λ/100. The patterns found by principal component analysis reflect the underlying scattering physics and reveal the role the scattering nanostructure plays in localization success. The technique described here is highly general and can be applied to gain insight into and perform subdiffractive parameter retrieval in various applications.
Subject
Super-resolution
Metrology
Ooptical sensing
Nanostructure
Cathodoluminescence
Plasmonic antennas
High Tech Systems & Materials
Industrial Innovation
To reference this document use:
http://resolver.tudelft.nl/uuid:da1007e7-334f-46fe-8a72-971dad24a2c5
DOI
https://doi.org/10.1021/acsphotonics.0c01350
TNO identifier
955232
Publisher
American Chemical Society ACS
ISSN
2330-4022
Source
ACS Photonics, 7 (7), 3246-3256
Document type
article