Title
On the origin of amplitude reduction mechanism in tapping mode atomic force microscopy
Author
Keyvani Janbahan, A.
Sadeghian Marnani, H.
Goosen, H.
van Keulen, F.
Publication year
2018
Abstract
The origin of amplitude reduction in Tapping Mode Atomic Force Microscopy (TM-AFM) is typically attributed to the shift in resonance frequency of the cantilever due to the nonlinear tip-sample interactions. In this paper, we present a different insight into the same problem which, besides explaining the amplitude reduction mechanism, provides a simple reasoning for the relationship between tip-sample interactions and operation parameters (amplitude and frequency). The proposed formulation, which attributes the amplitude reduction to an interference between the tip-sample and dither force, only deals with the linear part of the system; however, it fully agrees with experimental results and numerical solutions of the full nonlinear model of TM-AFM.
Subject
High Tech Systems & Materials
Industrial Innovation
Physical properties
Physics
Non-linear model
Numerical solution
Operation parameters
Reduction mechanisms
Resonance frequencies
TM-AFM
Tapping-mode atomic force microscopy
Tip-sample interaction
Atomic force microscopy
To reference this document use:
http://resolver.tudelft.nl/uuid:ff2710a9-48af-4b58-bda2-4d7e6897669e
TNO identifier
788512
ISSN
0003-6951
Source
Applied Physics Letters, 112 (16)
Article number
163104
Document type
article