Title
A quick method to determine the capacitance characteristics of thin layer X5R multilayer capacitors
Author
Mikkenie, R.
Steigelmann, O.
Groen, W.A.
ten Elshof, J.E.
Publication year
2012
Abstract
The effect of Y2O3 concentration on the dielectric properties of ceramic disc capacitors and multilayer capacitors containing 50 dielectric layers with an approximate thickness of 3µm were investigated. The relative permittivity and temperature coefficient of capacity of multilayer capacitors at low and high applied field suggest that two types of microstructures formed, depending on yttrium doping concentration. Yttrium concentrations of 1.5-2.0mol% yielded identical relative permittivities over a wide temperature range. The permittivities at Y concentrations of 2.6-3.0mol% were also identical, but somewhat higher. The relative permittivity of ceramic disc capacitors of similar composition, determined from hysteresis loop measurements as function of applied field, was compared with field-dependent permittivity measurements on multilayer capacitors. The results indicate that polarization measurements on CDCs are a good indicator for the relative permittivity values of MLCCs. © 2011 Elsevier Ltd.
Subject
Mechatronics, Mechanics & Materials
HOL - Holst
TS - Technical Sciences
High Tech Systems & Materials
Electronics
Industrial Innovation
BaTiO3
Capacitors
Dielectric properties
Hysteresis loop
Y2O3
Applied field
BaTiO3
Capacitance characteristics
Ceramic discs
Dielectric layer
Field-dependent permittivity
Hysteresis loop measurements
Multilayer capacitors
Polarization measurements
Relative permittivity
Temperature coefficient
Temperature range
Thin layers
Yttrium doping
Barium titanate
Ceramic materials
Hysteresis
Multilayers
Permittivity
Permittivity measurement
Yttrium
Yttrium alloys
Capacitors
To reference this document use:
http://resolver.tudelft.nl/uuid:f9e9e499-48cd-4568-ae60-288e8e8e0ad3
TNO identifier
442921
ISSN
0955-2219
Source
Journal of the European Ceramic Society, 32 (1), 167-173
Document type
article