Title
Combined characterization techniques to understand the stability of a variety of organic photovoltaic devices: the ISOS-3 interlaboratory collaboration
Author
Lira-Cantu, M.
Tanenbaum, D.M.
Norrman, K.
Voroshazi, E.
Hermenau, M.
Lloyd, M.T.
Teran-Escobar, G.
Galagan, Y.O.
Zimmermann, B.
Hösel, M.
Dam, H.F.
Jørgensen, M.
Gevorgyan, S.
Lutsen, L.
Vanderzande, D.
Hoppe, H.
Rösch, R.
Würfel, U.
Andriessen, H.A.J.M.
Rivaton, A.
Uzunoglu, G.Y.
Germack, D.
Andreasen, B.
Madsen, M.V.
Bundgaard, E.
Krebs, F.C.
Publication year
2012
Abstract
This work is part of the inter-laboratory collaboration to study the stability of seven distinct sets of state-of-the-art organic photovoltaic (OPVs) devices prepared by leading research laboratories. All devices have been shipped to and degraded at the Danish Technical University (DTU, formerly RISO-DTU) up to 1830 hours in accordance with established ISOS-3 protocols under defined illumination conditions. In this work we present a summary of the degradation response observed for the NREL sample, an inverted OPV of the type ITO/ZnO/P3HT:PCBM/PEDOT:PSS/Ag/Al, under full sun stability test. The results reported from the combination of the different characterization techniques results in a proposed degradation mechanism. The final conclusion is that the failure of the photovoltaic response of the device with time under full sun solar simulation, is mainly due to the degradation of the electrodes and not to the active materials of the solar cell. © 2012 SPIE.
Subject
Degradation
Metal electrodes
Organic solar cells
Polymer solar cells
Polymer/metal interaction
Stability
High Tech Systems & Materials
Industrial Innovation
Mechatronics, Mechanics & Materials
HOL - Holst
TS - Technical Sciences
To reference this document use:
http://resolver.tudelft.nl/uuid:e8e6fcaf-a503-4d20-a5b5-9ac853b6e042
TNO identifier
469532
ISBN
9780819491893
ISSN
0277-786X
Source
Reliability of Photovoltaic Cells, Modules, Components, and Systems V, 13-16 August 2012, San Diego, CA, USA, 8472 (8472)
Series
Proceedings of SPIE - The International Society for Optical Engineering
Document type
conference paper