Title
The E-NIS instrument on-board the ESA Euclid Dark Energy Mission: a general view after positive conclusion of the assesment phase
Author
TNO Industrie en Techniek
Valenziano, L.
Zerbi, F.M.
Cimatti, A.
Bianco, A.
Bonoli, C.
Bortoletto, F.
Bulgarelli, A.
Butler, R.C.
Content, R.
Corcione, L.
Rosa, A.de
Franzetti, P.
Garilli, B.
Gianotti, F.
Giro, E.
Grange, R.
Leutenegger, P.
Ligori, S.
Martin, L.
Mandolesi, N.
Morgante, G.
Nicastro, L.
Riva, M.
Robberto, M.
Sharples, R.
Spanó, P.
Talbot, G.
Trifoglio, M.
Wink, R.
Zamkotsian, F.
Publication year
2010
Abstract
The Euclid Near-Infrared Spectrometer (E-NIS) Instrument was conceived as the spectroscopic probe on-board the ESA Dark Energy Mission Euclid. Together with the Euclid Imaging Channel (EIC) in its Visible (VIS) and Near Infrared (NIP) declinations, NIS formed part of the Euclid Mission Concept derived in assessment phase and submitted to the Cosmic Vision Down-selection process from which emerged selected and with extremely high ranking. The Definition phase, started a few months ago, is currently examining a substantial re-arrangement of the payload configuration due to technical and programmatic aspects. This paper presents the general lines of the assessment phase payload concept on which the positive down-selection judgments have been based. © 2010 SPIE.
Subject
Cosmology
IR spectroscopy
Space mission
Assesment
Assessment phase
Dark energy
Definition phase
IR spectroscopy
Mission concepts
Near Infrared
Near infrared spectrometer
Re-arrangement
Selection process
Space missions
Spectroscopic probes
Astrophysics
Cosmology
Infrared spectrometers
Instruments
Millimeter wave devices
Millimeter waves
Optical telescopes
Space telescopes
Space flight
Space
Information Society
Physics & Electronics
SSE - Space Systems Engineering
TS - Technical Sciences
To reference this document use:
http://resolver.tudelft.nl/uuid:bd6d0efc-b7b5-4794-bfef-dabcd8b4e2c7
TNO identifier
425160
ISBN
9780819482211
ISSN
0277-786X
Source
Space Telescopes and Instrumentation 2010: Optical, Infrared, and Millimeter Wave, 27 June-2 July 2010, San Diego, CA, USA, 7731 (7731)
Series
Proceedings of SPIE - The International Society for Optical Engineering
Document type
conference paper