Print Email Facebook Twitter Piezoelectricity enhancement of P(VDF/TrFE) by X-ray irradiation Title Piezoelectricity enhancement of P(VDF/TrFE) by X-ray irradiation Author Pilet, N. Khikhlovskyi, V. van Breemen, A.J.J.M. Michels, J.J. Kemerink, M. Gelinck, G. Warnicke, P. Bernard, L. Publication year 2016 Abstract Organic electronics is becoming more and more important because the low level of fabrication and deposition complexity even at large scale makes it a good candidate for future low cost technological product development. P(VDF-TrFE) is a co-polymer of special interest due its ferroelectric property enabling usage in re-programmable non-volatile organic memory and magnetoelectric sensors. Piezo force microscopy (PFM) provides access to the technologically relevant ferroelectric polarisability and its remanent polarization via imaging of the piezoelectric property. Here we use PFM to show that piezoelectric response of a P(VDF-TrFE) film can be enhanced by up to 260 % after soft X-ray irradiation. This enhancement correlates with morphological change of part of the film, from amorphous to crystalline. An optimal irradiation dose is found above which the film gets eroded and the piezoelectric response gets lowered. Subject Nano TechnologyHOL - HolstTS - Technical SciencesElectronicsIndustrial InnovationAFMMorphologyOrganic memoryP(VDF-TrFE)Piezo force microscopyPiezoelectric polymerSTXM To reference this document use: http://resolver.tudelft.nl/uuid:bcb9c829-40f3-4e45-8d22-ba069826e062 DOI https://doi.org/10.1016/j.orgel.2016.06.039 TNO identifier 546235 Publisher Elsevier ISSN 1566-1199 Source Organic Electronics: physics, materials, applications, 37, 257-262 Document type article Files To receive the publication files, please send an e-mail request to TNO Library.