Print Email Facebook Twitter Screening of Integrated GaAs Stacked-FET Power Amplifiers Title Screening of Integrated GaAs Stacked-FET Power Amplifiers Author van der Bent, G. de Hek, A.P. van Vliet, F.E. Publication year 2019 Abstract The manufacturing of radar front-ends is preferably performed with components that are fully tested and known to be functional. This decreases the chances of instant failure or rapid degradation of the system. Complete testing of the RF-performance of the individual MMICs, however, is not always possible due to technical, infrastructural or financial limitations. A good alternative is the screening of several DC parameters that are relevant for a reliable operation. Commonly used parameters for this DC-screening are the pinch-off voltage and off-state breakdown voltage of the transistors. To measure these parameters on all transistors, access is required to the gate, drain and source terminals of these transistors. In a Stacked-FET amplifier not all transistors terminals are directly accessible via DC pads and the inclusion of extra pads will result in a significantly larger layout. The goal therefore is to measure the DC behaviour without the need for extra DC pads. In this article methods are developed to support this goal. © 2019 European Microwave Association (EuMA). Subject Defence ResearchDefence, Safety and SecurityGallium arsenideIII-V semiconductorsTransistorsComplete testingDC parametersFET amplifiersOff-state breakdown voltagesPinch off voltageRapid degradationReliable operationRF performancePower amplifiers To reference this document use: http://resolver.tudelft.nl/uuid:b80272e1-1f25-4556-8c34-a55fc779138c TNO identifier 871867 Publisher Institute of Electrical and Electronics Engineers Inc. ISBN 9782874870552 Source 2019 49th European Microwave Conference, EuMC 2019, 49th European Microwave Conference, EuMC 2019, 1 October 2019 through 3 October 2019, 908-911 Article number 8910885 Document type conference paper Files To receive the publication files, please send an e-mail request to TNO Library.