In this work, a new method, the scanning thermal microscopy method, is applied to study the durability of polymeric materials for space applications. The method was applied to study ground-tested as well as space-retrieved materials. Space-grade silicones, high-temperature polyimides, and the well-known second-surface-mirror-material, fluorinated ethylene propylene, were analyzed as materials. It is shown that the method is particularly suitable for the fluorinated ethylene propylene material, and subtle differences of the top surface layer caused by different exposure conditions (solar ultraviolet, vacuum ultraviolet radiation, thermal aging, etc.) can be revealed. The technique proves to be very suitable for the study of the surface-degradation effects of materials exposed to space as well as to a simulated space environment. Copyright © 2008 by the American Institute of Aeronautics and Astronautics, Inc. All rights reserved.